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- Authors can download USB proceeding from this site: https://zahirulalam.staffat.iium.edu.my/RSM_2023_USB.zip until 1st September 2023.
- Live usb can be found at https://zahirulalam.staffat.iium.edu.my/rsm23
- EDS wil be organizing EDS Mini Colloquium Click here for details
- EDS will be organizing Mentoring session during RSM 23. Click here for details
- Keynote speakers: Click here for details

We are pleased to invite you to the 14th 2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) at Langkawi, Malaysia. This bi-annual technical conference since 1997 aims at bringing together researchers from industry and academia to gather and explore various issues and trends in the field of semiconductor electronics. This is the 14th RSM organized by the Electron Devices Chapter of IEEE Malaysia Section and technically co-sponsored by the IEEE Electron Devices Society. Over the last eighteen years, the RSM conference series has become the prominent international forum on semiconductor electronics embracing all aspects of the semiconductor technology from circuit device, modelling and simulation, photonics and sensor technology, MEMS technology, process and fabrication, packaging technology and manufacturing, failure analysis and reliability, material and devices and nanoelectronics.
Registered and presented paper will be submitted for inclusion in the IEEE Xplore database.
Information regarding IEEE Xplore database for 2023 IEEE RSM
2023 RSM Proceedings IEEE CATALOG NUMBERS
Media Type | Part Number | ISBN | Online ISBN |
XPLORE COMPLIANT | CFP2168N-ART | 979-8-3503-2368-9 | 2639-4642 |
USB | CFP2368-NUSB | 979-8-3503-2367-2 |
Indexing |
Accepted and presented papers will be submitted for inclusion into IEEE Xplore Digital Library. All conference papers included in IEEE Xplore will be indexed in the SCOPUS database. |
https://ieeexplore.ieee.org/xpl/conhome/1800578/all-proceedings
2021 https://ieeexplore.ieee.org/xpl/conhome/8931667/proceeding
2019 https://ieeexplore.ieee.org/xpl/conhome/8931667/proceeding
2017 https://ieeexplore.ieee.org/xpl/conhome/8062165/proceeding
2015 https://ieeexplore.ieee.org/xpl/conhome/7337633/proceeding
2013 https://ieeexplore.ieee.org/xpl/conhome/6685220/proceeding
2011 https://ieeexplore.ieee.org/xpl/conhome/6086117/proceeding
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